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Jul 16, 2013 23:01
10 yrs ago
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French term
voile parasite
French to English
Tech/Engineering
Mechanics / Mech Engineering
Non-destructive examination
This appears in a set of specifications for non-destructive examination techniques, ultrasonic examination in this case:
Les paramètres influents de premier ordre pour la sensibilité de détection, pour le type de rayonnement choisi, sont :
la position de la source,
l’épaisseur (et l’absorption) du (des) matériau(x) traversé(s),
le flou géométrique (distance source-film, dimension de la source),
la sensibilité du récepteur (classe de système film radiographique),
la densité optique minimale (hors **voile parasite**) définie pour le procédé.
I'm thinking along the lines of parasitic noise, but would appreciate your comments!
Many thanks
Les paramètres influents de premier ordre pour la sensibilité de détection, pour le type de rayonnement choisi, sont :
la position de la source,
l’épaisseur (et l’absorption) du (des) matériau(x) traversé(s),
le flou géométrique (distance source-film, dimension de la source),
la sensibilité du récepteur (classe de système film radiographique),
la densité optique minimale (hors **voile parasite**) définie pour le procédé.
I'm thinking along the lines of parasitic noise, but would appreciate your comments!
Many thanks
Discussion
http://books.google.com/books?id=GSd0IqSt3bsC&pg=PA142&lpg=P...
But there is also the possibility of this 'veiling', which may arise from a number of different causes (is this explained later in your text?), but which is NOT inherent to the process itself, and hence is excluded from this list of limiting factors.
And I'd steer clear of 'parasitic', as not really being applicable to this imaging context; the idea here is probably more like 'spurious' (though there may be the same notion of 'interference' behind it as in telecommunications) — though arguably, 'veiling' in EN is inherently unwanted (hence spurious), and do it might not even be necessary to render that at all.
Re-reading, it seems as if the minimum density expected is due to the process as a whole, whereas this spurious effect (not being included here as an influencing parameter) presumably comes from some other outside cause, and thus is not an intrinsic system limitation.